A compact microwave sensor for characterisation of radomes and dielectric signature detection of materials in 3G and 4G GSM bands
A novel and highly-compact tri-band epsilon near-zero (ENZ) substrate-integrated waveguide (SIW)-based microwave sensor for material testing at the global system for mobile communications (GSM) bands is proposed. It is designed, simulated, and tested in-house for the microwave characterization of materials under test in 3G and 4G frequency bands. Its size is less and facilitates a sample placement design for microwave measurement of the sample under test at various frequencies of 3G and 4G bands. The detection of the dielectric signature of the material under test at multiple frequencies with reasonable sensitivity has been done. It is fabricated using a multilayer FR4 substrate where a three-layered ENZ tunnel is machined for the testing. The RF signal is being coupled to the prototype using the SubMiniature version A (SMA) connectors which are then collected at another end, using the network analyzer. The measured data is then processed with the standard algorithm for getting the dielectric signature of various reference samples. It is found to be in good agreement with their reference values thus validating the design methodology, proposed technique, and the developed prototype.
Link: The cost, weight, and size of the corresponding cavity becomes quite large, especially in the lower frequency bands which are quite bulky and expensive, thus making it in Prototype.
Problem Scale: Around The World
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